Soft errors from particles to circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment one of the most important . Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics material sciences circuit design and chip architecture and operation but also cosmic ray physics natural radioactivity issues particle detection and related instrumentation. This book provides a detailed treatment of radiation effects in electronic devices including effects at the material device and circuit levels the emphasis is on transient effects caused by single ionizing particles single event effects and soft errors and effects produced by the cumulative energy deposited by the radiation total ionizing dose effects bipolar si and sige metal . Soft errors from particles to circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment one of the most important primary limits for modern digital electronic reliability covering the fundamentals of soft errors as well as engineering considerations and technological aspects this robust text discusses the
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